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Test Escapes: Analysis of Short Defect

M. RenovellF. AzaïsY. Bertrand

This paper analyzes the different types of test escape with the final objective to propose a solution to minimize some of the test escapes. Using a simple example of short defect in the context of Boolean testing, it is first demonstrated that the defect behavior depends on unpredictable parameters. It is shown that a defect may be detectable with a vector but for a given domain of the unpredictable parameter called the Detection Domain. Using the concept of Detection Domain, 3 different types of test escape are identified. It is then demonstrated that one type of test escape can be minimized using 'Improved fault models'.

http://csdl.computer.org/dl/proceedings/sbcci/1999/0387/00/03870160.pdf

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